The global failure analysis test equipment for semiconductors market size is anticipated to reach USD 3.51 billion by 2030, registering a CAGR of 8.2% from 2025 to 2030, according to a new report by Grand View Research, Inc. The growth of the failure analysis test equipment for semiconductors industry is primarily driven by the increasing demand for high-performance semiconductors across various industries, including consumer electronics, automotive, telecommunications, and healthcare. As semiconductor technology advances, there is a growing need for more sophisticated testing equipment to ensure product reliability, performance, and defect detection at smaller scales. Additionally, the shift towards next-generation technologies like AI, 5G, and IoT requires semiconductors to meet stringent quality standards, further boosting the demand for failure analysis tools.
Market opportunities lie in the expansion of semiconductor manufacturing capacities in emerging markets, particularly in Asia Pacific and regions like India and Brazil. The increasing adoption of electric vehicles (EVs) and renewable energy solutions is also driving growth, as these sectors require highly reliable semiconductors. Moreover, as governments around the world invest in domestic semiconductor manufacturing, particularly through initiatives like the CHIPS Act in the U.S. and India’s "Make in India" program, there are significant opportunities for suppliers of failure analysis equipment to expand their presence in these regions.
Regulations governing the semiconductor industry play a crucial role in shaping the market for failure analysis test equipment. Stringent quality control standards and environmental regulations, particularly in developed regions like North America and Europe, demand advanced testing to ensure that semiconductors meet both performance and safety requirements. The growing focus on sustainability and reducing the environmental impact of electronics also drives the need for precise failure analysis to minimize waste and improve manufacturing processes.
Top market players, such as Thermo Fisher Scientific, Hitachi High-Technologies, Carl Zeiss, and Oxford Instruments, focus on strategic initiatives like innovation, mergers and acquisitions, and expanding their global footprint. For instance, in November 2023, Thermo Fisher Scientific unveiled the Meridian EX System, designed to provide accurate fault localization in advanced semiconductor logic technologies
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Based on product, the Scanning Electron Microscope (SEM) segment led the market in 2024, driven by the increasing demand for high-resolution imaging in semiconductor manufacturing.
Based on application, the Focused Ion Beam (FIB) segment dominated the market in 2024 due to the need for precise analysis, high-resolution imaging, and defect detection in advanced semiconductor packaging and quality control.
Based on region, Asia Pacific dominated the market in 2024, driven by the increasing demand for advanced semiconductor devices across various industries such as automotive, consumer electronics, and telecommunications.
In November 2024, Hitachi High-Technologies Corporation and The University of Tokyo began joint research to explore practical applications of the high-resolution Laser-PEEM*1, developed by UTokyo, in semiconductor manufacturing. The company will continue collaborating with UTokyo, gaining insights into the needs of semiconductor manufacturers to address challenges in the shipping & manufacturing processes.
Grand View Research, Inc. has segmented the global failure analysis test equipment for semiconductors market based on product, technology, and region:
Failure Analysis Test Equipment For Semiconductors Product Outlook (Revenue, USD Million, 2018 - 2030)
Scanning Electron Microscope (SEM)
Transmission Electron Microscope (TEM)
Focused Ion Beam System (FIB)
Scanning Acoustic Microscopy (SAM)
Fourier-Transform Infrared Spectroscopy (FTIR)
Dual Beam System
Others
Failure Analysis Test Equipment For Semiconductors Technology Outlook (Revenue, USD Million, 2018 - 2030)
Energy Dispersive X-Ray Spectroscopy (EDX)
Secondary Ion Mass Spectroscopy (SIMS)
Focused Ion Beam (FIB)
Broad Ion Miling (BIM)
Relative Ion Etching (RIE)
Scanning Probe Microscope (SPM)
Others
Failure Analysis Test Equipment For Semiconductors Regional Outlook (Revenue, USD Million, 2018 - 2030)
North America
U.S.
Canada
Mexico
Europe
UK
France
Germany
Italy
Spain
Asia Pacific
China
India
Japan
South Korea
Taiwan
Australia
Latin America
Brazil
Argentina
Middle East & Africa
Israel
Saudi Arabia
UAE
List of Key Players in Failure Analysis Test Equipment For Semiconductors Market
AMETEK MOCON
Thermo Fisher Scientific Inc.
Hitachi High-Technologies Corporation
Carl Zeiss AG
Oxford Instruments
HORIBA, Ltd.
Bruker
Jeol Ltd.
Tescan Orsay Holding
Imina Technologies SA.
Leica Microsystems
TED PELLA Inc
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